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Showing 1 to 2 of 2 for “"Hyperthermal surface ionisation (HSI)"”.
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Application of scanning micro-tip and UHV Kelvin probes in surface and material characterisation.
… utilising the scanning Kelvin probe (SKP) for surface potential mapping and monitoring changes in work function due to environmental influences in ambient and UHV conditions. The SKP is a truly non-contact technique which determines local work function changes and surface states on conductors, …
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Study of semiconductor and metal surfaces using a novel scanning Kelvin probe.
… vibrating reference electrode (the tip) and the surface under investigation. It utilises a non-contact, non-destructive measurement mode allowing work function measurements at temperatures in the range from (300 - 1100) K. The work function is a multi-parameter variable highly sensitive to …