Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
Results
Showing 1 to 20 of 58 for “"Hot-carrier"”.
-
Plasmonic hot carrier-driven electrochemistry
… energy has sparked widespread interest in photocatalysts, including systems based on plasmonic metal nanoparticles. To take advantage of these materials, a fundamental understanding of how plasmon-induced hot-carriers drive chemical reactions is needed. This work examines how different hot …
-
Predicting CMOS Hot Carrier Degradation in VLSI Circuits
Reliability simulation of a 51-stage ring-oscillator was performed. The circuit lifetime improvement due to D2 anneal can be well estimated by the device dc lifetime improvement data.
-
Hot carrier degradation in deep submicron n-MOS technologies
With the aggressive scaling of MOS devices hot carrier degradation continues to be a major reliability concern. The LDD technologies, which have been used to minimise the hot carrier damage in MOS devices, suffer from the spacer damage causing the drain series resistance degradation, along with the …
-
Analysis of hot-carrier AC lifetime model for MOSFET
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
-
Hot-carrier reliability evaluation for CMOS devices and circuits
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
-
Hot-carrier reliability assessment in CMOS digital integrated circuits
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
-
A simulation and redesign system for circuit hot-carrier reliability
… design system for CMOS VLSI circuit hot-carrier reliability estimation and redesign is presented. The system first simulates circuits to determine the critical transistors that are most susceptible to hot-carrier effect (HCE); it then estimates the impact of HCE on circuit performance …
-
Characterization of hot-carrier reliability in analog sub-circuit design
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
-
Hot-carrier reliability of MOSFETs at room and cryogenic temperature
Hot-carrier reliability is an increasingly important issue as the geometry scaling of MOSFET continues down to the sub-quarter micron regime. The power-supply voltage does not scale at the same rate as the device dimensions, and thus, the peak lateral E-field in the channel increases. Hot-carriers, …
-
On the methodology of assessing hot-carrier reliability of analog circuits
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
-
Langmuir Blodgett films of colloidal silicon quantum dots for hot carrier photovoltaics
… colloidal QDs solar cells. Moreover, favourable carrier dynamics are revealed in colloidal QDs, such as multiple exciton generation and slowed carrier cooling, which potentiate the demonstration of third generation solar cells. This thesis develops methods to assembly solution-form colloidal Si …
-
Modeling and simulation ofpMOSFET hot-carrier degradation in very large CMOS circuits
… thesis are to model submicron pMOS transistor hot-carrier degradation and to develop a fast reliability simulation tool for hot-carrier reliability analysis of CMOS VLSI circuits. This simulator should be able to handle very large submicrometer circuits accurately and efficiently.
-
Optical hot carrier solar cell: A general method of spectrum management in photovoltaics
… design and operating principles of the optical hot carrier solar cell (OHCSC) have been investigated in this thesis. An OHCSC integrates a hot carrier absorber and a conventional solar cell using a photonic structure called the optical contact, which enhances the carrier hot-luminescence …
-
Modeling and simulation of hot-carrier induced device and circuit degradation for VLSI reliability
… approach is presented for estimating the hot-carrier induced degradation of MOSFET device characteristics and circuit performance. The proposed simulation tool provides information on (i) the evolution of device and circuit performance degradation during long-term dynamic operation, (ii) …
-
Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
-
Study Of Oxide Breakdown, Hot Carrier And Nbti Effects On Mos Device And Circuit Reliability
… channel electric field becomes higher and the hot carrier (HC) effect becomes more significant. When the oxide is scaled down to less than 3 nm, gate oxide breakdown (BD) often takes place. As a result, oxide trapping and interface generation cause long term performance drift and related …
-
Fundamentals and Applications of the Hydrogen /Deuterium Isotope Effect in Improved Hot -Carrier Reliability of MOS Devices
*Originally published in DAI Vol. 62, No. 6. Reprinted here with corrected author name.
Page 1 of 3