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Showing 1 to 1 of 1 for “"High efficiency helium detector"”.
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Instrumentation and contrast mechanisms in scanning helium microscopy
Scanning helium microscopy (SHeM) is a novel form of microscopy that uses low energy (5-100 meV) helium atoms to image the surface of a sample. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces, but that also means it can be difficult to manipulate for …