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Showing 1 to 1 of 1 for “"HfSixOy"”.

  1. Materials properties of hafnium and zirconium silicates: Metal interdiffusion and dopant penetration studies.

    … alternate gate dielectric candidates ZrSixOy and HfSixOy are presented. Dopant penetration studies from doped-polysilicon through HfSixOy and HfSixOyNz are also presented. Rutherford backscattering spectroscopy (RBS), heavy ion RBS (HI-RBS), x-ray photoelectron spectroscopy (XPS), high resolution …

    unt Repository record for Materials properties of hafnium and zirconium silicates: Metal interdiffusion and dopant penetration studies. (opens in a new tab)