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Showing 1 to 3 of 3 for “"HS-AFM"”.
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Origin of Creep-Fatigue Back Stress and its Effect on Deformation and Damage
… (SANS) and high-speed atomic force microscope (HS-AFM) techniques. Intergranular strains were found to significantly affect the minimum creep deformation rate of type 316H austenitic stainless steel, whereas no evidence of that for intragranular strains was observed, at the early stage of creep …
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Nanopores, megatonnes, and milliseconds : exploring engineered peptides as antimicrobial, carbon-capture,and biocatalytic agents
… using a high-speed atomic force microscope (HS-AFM). The fast time resolution of the HS-AFM (13 seconds per image) enabled characterization of the initial stages of the killing of live Escherichia coli cells. The results suggested that the killing process of CM15 is a combination of a …
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The effect of radiation damage by fission fragments on the structural stability and dissolution of the UO2 fuel matrix
… focused ion beam (FIB), atomic force microscopy (AFM), energy dispersive X-ray (EDX) spectroscopy, electron probe microanalysis (EPMA), X-ray diffraction (XRD), electron backscatter diffraction (EBSD), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS) techniques to …