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Showing 1 to 3 of 3 for “"Glass Defects"”.

  1. Machine Learning Methods for Automated Macro-Inspection and Improved Defect Identification in Semiconductor Manufacturing

    … to improve macro-inspection capability of defects on wafers at a semiconductor wafer fab. First, an investigation into the performance of current inspection tools is done, revealing results that are not reliable nor reproducible. Tool maintenance procedures and specification adjustments are …

    mit Repository record for Machine Learning Methods for Automated Macro-Inspection and Improved Defect Identification in Semiconductor Manufacturing (opens in a new tab)

  2. Deep Transfer Learning for Macroscale Defect Detection in Semiconductor Manufacturing

    … regarding the presence of macroscale defects. In this work, a model for detecting central defects is described in detail, and a novel approach to overcoming data scarcity through the creation of synthetic data is deployed. The binary classifier model achieves an out-of-distribution …

    mit Repository record for Deep Transfer Learning for Macroscale Defect Detection in Semiconductor Manufacturing (opens in a new tab)

  3. Towards the harnessing of the structural properties of optical fiber

    Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2026-12-01

    uiuc Repository record for Towards the harnessing of the structural properties of optical fiber (opens in a new tab)