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Showing 1 to 2 of 2 for “"Force-Distance Curve"”.
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Optomechanical damping of a microcantilever force sensor in liquid
A new instrument, constant deflection atomic force microscopy (CD-AFM) constructed to perform force spectroscopy measurements without mechanical instabilities associated with the use of soft AFM cantilevers has been developed, tested and calibrated. One of the major limitations associated with the …
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Nanomechanical viscoelastic characterization of rubber with atomic force microscopy (AFM)
Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2022-11-14 without embargo terms