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Showing 1 to 20 of 141 for “"Focused Ion Beam"”.

  1. Nanofabrication using focused ion beam

    Focused ion beam (FIB) technique uses a focused beam of ions to scan the surface of a specimen, analogous to the way scanning electron microscope (SEM) utilizes electrons. Recent developments in the FIB technology have led to beam spot size below 10 nm, which makes FIB suitable for nanofabrication. …

    cambridge Repository record for Nanofabrication using focused ion beam (opens in a new tab)

  2. Josephson junctions fabricated by focused ion beam.

    cambridge

  3. Focused ion beam assisted deposition of gold

    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Nuclear Engineering, 1986.

    mit Repository record for Focused ion beam assisted deposition of gold (opens in a new tab)

  4. Focused ion beam induced deposition of copper

    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1993.

    mit Repository record for Focused ion beam induced deposition of copper (opens in a new tab)

  5. Focused Ion Beam Fabricated Non-equilibrium Superconducting Devices

    The developments over the last decade in Focused Ion Beam (FIB) instrument technology have reached a point where there is sufficient control of an ion beam to make cuts, trenches, and other shapes in a sample on a scale of tens of nanometers. This work concentrates on the use of an FIB instrument …

    cambridge Repository record for Focused Ion Beam Fabricated Non-equilibrium Superconducting Devices (opens in a new tab)

  6. Laser-assisted focused-ion-beam-induced deposition of copper

    Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.

    mit Repository record for Laser-assisted focused-ion-beam-induced deposition of copper (opens in a new tab)

  7. Characterisation of focused ion beam nanostructures by transmission electron microscopy

    Ion irradiation is an effective tool for the modifcation and control of the properties of magnetic thin films. Basic magnetic properties such as coercivity and local anisotropy direction can be altered in NiFe (Permalloy) films, whilst for Co/Pd multilayers, ion irradiation results in a transition …

    glasgow Repository record for Characterisation of focused ion beam nanostructures by transmission electron microscopy (opens in a new tab)

  8. Feasibility study of spatial-phase-locked focused-ion-beam lithography

    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.

    mit Repository record for Feasibility study of spatial-phase-locked focused-ion-beam lithography (opens in a new tab)

  9. Nanopore/Nanotube Pattern Formation through Focused Ion Beam Guided Anodization

    Anodization is a kind of method that can produce oxide layer in a large area and on flexible shaped metals. In some specific conditions, anodic oxide layers exhibit interesting nanopore/nanotube structures. In this work, focused ion beam patterning method is introduced to general anodization, …

    vt Repository record for Nanopore/Nanotube Pattern Formation through Focused Ion Beam Guided Anodization (opens in a new tab)

  10. Characterization of ionic liquid ion sources for focused ion beam applications

    In the Focused Ion Beam (FIB) technique, a beam of ions is reduced to nanometer dimensions using dedicated optics and directed to a substrate for patterning. This technique is widely used in micro- and nanofabrication for etching, material deposition, microscopy, and chemical surface analysis. …

    mit Repository record for Characterization of ionic liquid ion sources for focused ion beam applications (opens in a new tab)

  11. Mechanisms of focused ion beam (FIB) material removal and rearrangement at high beam flux

    Focused ion beam (FIB) is widely used as a material removal tool for applications ranging from electron microscope sample preparation to nanopore processing for DNA sequencing. Despite the wide spread use of FIB, the basic material removal mechanisms are not well understood and may depend upon FIB …

    uiuc Repository record for Mechanisms of focused ion beam (FIB) material removal and rearrangement at high beam flux (opens in a new tab)

  12. Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films

    … devices. This work is a preliminary investigation of the effects of two film growth parameters deposition rate and substrate temperature - on porosity. We employ the focused ion beam tomography technique to characterize and quantify porosity in tin sulfide thin films. We then generate 3D …

    mit Repository record for Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films (opens in a new tab)

  13. Focused Ion Beam Created Refractive and Diffractive Lens Techniques for the Improvement of Optical Imaging through Silicon

    … refraktiver und diffraktiver Festkörperimmersionslinsen (SILs) aus Silizium (Si) mit einer fokussierten Ionenstrahlanlage (FIB). SILs werden zur optischen Auflösungsoptimierung benötigt, wenn aktive Gebiete nur durch die Rückseite des Chips untersucht werden können. Kommerzielle SIL-Objektive …

    tu-berlin Repository record for Focused Ion Beam Created Refractive and Diffractive Lens Techniques for the Improvement of Optical Imaging through Silicon (opens in a new tab)

  14. Numerical Characterization of Fragmentation in Ionic Liquid Clusters

    Ionic liquid ion sources are a promising technology that can be used for many applications from space propulsion to focused ion beam microetching. The variety of ionic liquids that can be synthesized enables the selection of desired beam properties for optimizing propulsion and focused ion beam

    mit Repository record for Numerical Characterization of Fragmentation in Ionic Liquid Clusters (opens in a new tab)

  15. Increasing the bit density of a quantum confinement physically unclonable function

    This dissertation presents work carried out in collaboration with the IMDEA nanoscience institute. We study the recently proposed quantum confinement physically unclonable function by Roberts, et al. that utilises resonant tunnelling diodes (physical representation of a quantum well) and atomic …

    lancaster Repository record for Increasing the bit density of a quantum confinement physically unclonable function (opens in a new tab)

  16. Unique Approaches to Interfacial Nanoscience

    Other applications of the nanofabrication techniques are also explored. The nanopatterning of mica with a focused ion beam (FIB), shown for the first time here, has led to the formation of a wide variety of nanorod structures embedded in and supported by a number of different surfaces. The …

    uiuc Repository record for Unique Approaches to Interfacial Nanoscience (opens in a new tab)

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