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Showing 1 to 1 of 1 for “"Fast Dynamic NBTI, SiON, Nit, Not, MIM"”.
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Selected topics on advanced electron devices and their circuit applications
… study of Negative Bias Temperature Instability (NBTI) in p-MOSFETs with ultra-thin SiON gate dielectric is reported. By using the fast pulsed method, a fast Dynamic NBTI (DNBTI) component is distinguished from the conventional slow one for the first time. Evidence has been shown that this …