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Showing 1 to 1 of 1 for “"FPGA-based testing system"”.
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Spatio-temporal circuits for imaging sensors
… In the past decade, the third-generation systems presented (a) large format (1 Mpixels to 16 Mpixels), (b) higher operating temperature (200 K to 250 K for MWIR, and 120 K to 150 K for LWIR), and (c) multicolor operation. The emphasis demanded for the next generation of devices is the …