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Showing 1 to 1 of 1 for “"Eshelby inclusion model"”.
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Electromechanical response of textured ferroelectric PZT thin film stacks
… film thickness and grain size was successfully modeled, providing insight into the deformation behavior of polycrystalline metal films grown epitaxially on polycrystalline underlayers. Mechanical experiments on (SiO2-TiO2-Pt-PZT) and full PZT stacks (SiO2-TiO2-Pt-PZT-Pt-ALD) showed that the …