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Showing 1 to 1 of 1 for “"Electrostatic Discharge, Integrated Circuits"”.

  1. ESD circuit design and measurement techniques

    Ayling, Alex EbenUniversity of Illinois at Urbana-Champaign2020

    Part 1 of this thesis presents a method to measure sub-nanosecond reverse recovery in wafer-level test structures. The setup uses a transmission line pulse generator with a time domain through connection to measure the device under test current. The setup is then used to measure reverse recovery in …

    uiuc Repository record