Global ETD Search

Stochastic Models of Surface Limited Electronic and Heat Transport in Metal and Semiconductor Contacts, Wires, and Sheets---Micro to Nano

Martin, Pierre NicolasUniversity of Illinois at Urbana-Champaign2015

… of surface roughness in coupled mechanical, electronic and thermal processes in N/MEMS and semiconductor devices in the 10 nm - 1 mum range. A model is presented to estimate roughness rms Delta and autocorrelation L from experimental surfaces and edges, and subsequently generate statistical …

uiuc Repository record for Stochastic Models of Surface Limited Electronic and Heat Transport in Metal and Semiconductor Contacts, Wires, and Sheets---Micro to Nano (opens in a new tab)

Stochastic Models of Surface Limited Electronic and Heat Transport in Metal and Semiconductor Contacts, Wires, and Sheets — Micro to Nano

Martin, Pierre N.University of Illinois at Urbana-Champaign2011

… ect of surface roughness in coupled mechanical, electronic and thermal processes in N/MEMS and semiconductor devices in the 10 nm - 1 m range. A model is presented to estimate roughness rms and autocorrelation L from experimental surfaces and edges, and subsequently generate statistical series of …

uiuc Repository record for Stochastic Models of Surface Limited Electronic and Heat Transport in Metal and Semiconductor Contacts, Wires, and Sheets — Micro to Nano (opens in a new tab)

Wpływ efektów interferencyjnych i korelacji kulombowskich na transport elektronowy przez układy kropek kwantowych

Trocha, Piotr2011

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