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Showing 1 to 20 of 118 for “"Electron spectroscopy"”.

  1. Transition-Edge Sensors for Electron Spectroscopy

    Patel, KunalUniversity of Cambridge2023

    … little attention, notably within the field of electron spectroscopy where TESs could provide significant advantages over existing electron spectrometers. In this thesis, I present the first investigation into the capabilities of TESs in electron spectroscopy using a combination of numerical …

    cambridge Repository record

  2. SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS

    HAN WEIDING2019

    The scanning electron microscope (SEM) is a powerful high resolution imaging instrument used in multiple fields of study today. The low energy scattered electrons inside it, used mainly for topographic image of a sample’s surface, contain valuable information in the emitted energy spectrum. In this …

    nus Repository record

  3. AUGER ELECTRON SPECTROSCOPY OF CRYOGENIC MATRIX ISOLATED METAL ATOMS AND DIRECT RECOIL SPECTROSCOPY (DRS), SIMS AND XPS STUDIES ON TITANIUM AND PIQ

    SCHMIDT, HOWARD KHANRice University1987

    Auger electron spectra of matrix-isolated metal atoms have been recorded for the first time. Differences in extra-atomic relaxation between bulk metal and argon matrix isolated atoms resulted in shifts in the energy of LMM Auger electrons, $-3.1$ eV for potassium and $-8.7$ eV for titanium. The sum …

    rice Repository record

  4. Microstructure and Microchemistry of Titanium-Carbide Coated Cemented Carbides

    Sharma, Nirmal KumarUniversity of Illinois at Urbana-Champaign2014

    … contemporary micro-analytical techniques: Auger Electron Spectroscopy, STEM X-ray microchemical analysis and electron energy loss spectroscopy. As most of the analytical technique

    uiuc Repository record

  5. Characterization of heat-treated nickel and gold films on silicon single crystals

    Yoon, Ki HyunUniversity of Missouri--Rolla2016

    <p>"An experimental electron impact ionization source was used to determine the presence of various neutral atoms and molecules on metallized and bare surfaces of silicon wafers. The metallization consisted of thin films of nicke l and gold separately and in combination. The major surface …

    must-thes Repository record

  6. Filament-Assisted Chemical Vapor Deposition of Diamond and Its Mechanism

    Chen, Zhong-JiaUniversity of Illinois at Urbana-Champaign2014

    … were characterized by techniques such as Raman spectroscopy, X-ray diffraction (XRD), Auger electron spectroscopy (AES), and scanning electron microscopy (SEM).

    uiuc Repository record

  7. An electrochemical and surface analytical investigation of iron oxidation, passivation and corrosion inhibition

    Kamrath, Michael AnthonyUniversity of Illinois at Urbana-Champaign2011

    … Ultrahigh vacuum surface analysis by Auger electron spectroscopy (AES), low energy electron diffraction (LEED), thermal desorption mass spectrometry (TDMS) and ion bombardment (depth profiling) was used to investigate iron oxide films formed on iron by gas phase oxygen exposure as well as …

    uiuc Repository record

  8. Novel data-processing techniques for signal extraction in Project 8

    Kunicki, Theodora CMassachusetts Institute of Technology2016

    Project 8 presents a new modality of electron spectroscopy with the potential to exceed the resolution of the most precise electron spectrometers in operation today, potentially at much lower cost. Project 8, being a novel method, has different computational demands from existing experiments. This …

    mit Repository record

  9. Laser Chemical Vapor Deposition of Titanium Nitride and Process Diagnostics With Laser-Induced Fluorescence Spectroscopy

    Chen, XiangliUniversity of Illinois at Urbana-Champaign2014

    … Pulsed dye laser induced fluorescence (LIF) spectroscopy is used to obtain transient gas phase Ti atomic concentration above the substrate. Multi-wavelength pyrometry is applied to measure the surface temperature during deposition. Film thickness profiles are obtained by stylus profilometry, …

    uiuc Repository record

  10. Photolytic Laser-Induced Chemical Vapor Deposition for Aluminum Film Growth

    Gorbatkin, Steven MarkUniversity of Illinois at Urbana-Champaign2014

    … laser were investigated using optical emission spectroscopy, including time-resolved emission measurements. Position-resolved growth rate measurements were used to investigate film growth kinetics during photolysis of TMA using 248 nm light, and deposited films were analyzed using in-situ Auger …

    uiuc Repository record

  11. ΣΥΝΘΕΣΗ ΦΑΣΜΑΤΟΣΚΟΠΙΚΗ ΚΑΙ ΚΒΑΝΤΟΧΗΜΙΚΗ ΜΕΛΕΤΗ ΣΥΜΠΥΚΝΩΜΕΝΩΝ (Β) ΚΙΝΟΞΑΛΙΝΙΚΩΝ ΣΥΣΤΗΜΑΤΩΝ ΚΑΙ ΠΑΡΑΓΩΓΩΝ ΤΟΥΣ

    Βρεττού, ΜαρίαΑριστοτέλειο Πανεπιστήμιο Θεσσαλονίκης (ΑΠΘ)1991

    … ANDSYNTHESIS OF PYRAZINO [2,3-B] QUINOXALINES. ELECTRON SPECTROSCOPY OF CORRELATION OF SPECTROCHEMICAL DATA WITH THE RESULTS OF QUANTUM CALCULATIONS (CNDO/2-CI METHOD). INFRARED SPECTROSCOPY. NUCLEAR MAGNETIC RESONANCE (1H AND 13C-NNIR) INCONNECTION WITH A CALCULATED ELECTRONIC CHARGE. …

    greece Repository record

  12. Gold Surfaces for Dropwise Condensation

    Woodruff, David WinfieldUniversity of Illinois at Urbana-Champaign2014

    … from 200(ANGSTROM) to 5000(ANGSTROM). Auger electron spectroscopy and scanning electron microscopy were used to describe the heat transfer surfaces chemically and physically.

    uiuc Repository record

  13. Effects of Surface Oxidation on Vacancy Defects in Beta Nickel-Aluminum Alloys

    Parthasarathi, ArvindUniversity of Illinois at Urbana-Champaign2014

    Transmission Electron Microscopy and Auger Electron Spectroscopy has been used to make observations of the oxidation process in (beta)-NiAl alloys annealed under controlled conditions of temperature and oxygen partial pressure. Binary Ni-Al alloys, with nominally 47.5, 50.4 and 52.5 at .% Al, were …

    uiuc Repository record

  14. Low energy ion beam modification of the titanium silicide (100) reaction

    Scott, Philip ArthurUniversity of Illinois at Urbana-Champaign2011

    … of these thin films included transmission electron microscopy, scanning electron microscopy, scanning transmission electron microscopy, Auger electron spectroscopy, x-ray energy dispersive spectroscopy, and x-ray diffraction. The ion assisted deposition parameters which were investigated in …

    uiuc Repository record

  15. Development of Ti-Si-N and Ta-Si-N as diffusion barriers

    You, ShaoxinUniversity of Missouri--Rolla2016

    … X-ray diffractometry (XRD), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), auger electron spectroscopy (AES) and annealing in a controlled ambient atmosphere"--Abstract, page iv.

    must-thes Repository record

  16. Segregation and Phase Dynamics in Supported Bimetallic Nanoparticles

    Nashner, Michael SydneyUniversity of Illinois at Urbana-Champaign2015

    … silane (SiH$\sb4)$ is described. Using Auger electron spectroscopy (AES), Si was found to readily diffuse into the Pt substrate and sequentially form at least two unique intermetallic Pt-Si surface structural phases with $(\surd7$ x $\surd7)R\pm19.1\sp\circ$ and $(\surd19$ x …

    uiuc Repository record

  17. Coadsorption of anions and ultra-thin metal films on single crystal electrodes

    Sung, Yung-EunUniversity of Illinois at Urbana-Champaign2011

    … The anion and metal coverages from the Auger electron spectroscopy (AES) measurements were compared with results obtained by in situ radiochemical and electrochemical data. Using Low Energy Electron Diffraction (LEED), the structures of anions/underpotential deposition (UPD) admetals were …

    uiuc Repository record

  18. Preparation and characterization of metal/sapphire and metal/polyimide thin film laminates

    Peddada, Satyanarayana RaoUniversity of Illinois at Urbana-Champaign2011

    … TEM (XTEM), plan-view TEM, SEM, Auger Electron Spectroscopy and X-ray diffraction. Of these, XTEM was the most extensively used.

    uiuc Repository record

  19. Tribology and Micro-Chemistry of Sputter Deposited Composite Coatings on Honed Steel Substrates

    Wu, Lawrence Ching-YuUniversity of Illinois at Urbana-Champaign2014

    … coating chemistry was analyized by Auger Electron Spectroscopy (AES); in addition, AES was used to characterize the wear transfer mechanism between steel and the composite coating.

    uiuc Repository record

  20. An investigation of the temperature distribution induced during laser chemical vapor deposition (LCVD) of titanium nitride on titanium-aluminum-vanadium

    Azer, Magdi NaimUniversity of Illinois at Urbana-Champaign2011

    … microstructure have been determined by Scanning Electron Microscopy (SEM), Auger Electron Spectroscopy (AES), and X-ray Photoelectron Spectroscopy (XPS).

    uiuc Repository record

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