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Showing 1 to 1 of 1 for “"Electron Holographie"”.
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Quantitative off-axis Electron Holography and (multi-)ferroic interfaces
… be either directly or indirectly probed with an electron beam such as used in Transmission Electron Microscopy (TEM). Consequently, TEM is excellently suited for investigating ferroic materials, i.e., state-of-the-art instruments facilitate aberration corrected imaging within a large …