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Showing 1 to 1 of 1 for “"ESD test methods"”.
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Charged device model electrostatic discharge protection and test methods for integrated circuits
This work focuses on methods for testing and increasing the robustness of integrated circuits (ICs) to electrostatic discharge (ESD). Specifically, this work focuses on charged device model (CDM) protection and test methods. In this work it is shown that the CDM robustness of an I/O can be …