Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 4 of 4 for “"ECCI"”.
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Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors
… AFM and electron channelling contrast imaging (ECCI) are fast, non-destructive alternatives to TEM for dislocation characterisation. AFM and ECCI were used to assign TD type on the exact same region of an epitaxial lateral overgrowth GaN sample. Direct agreement was seen for vertical TDs, and …
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Dynamical models for novel diffraction techniques in SEM
… for electron channelling contrast imaging (ECCI) of threading dislocations (TDs) normal to the surface in wurtzite group-III nitride materials. I also introduce and use the notion of ECC-strain to study crystal features and to predict the behaviour of TDs contrast.For the electron …
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Growth and characterization of gallium arsenide phosphide and gallium phosphide on silicon for III-V/Si multi-junction solar cells
Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2024-08-01
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Enhancing hot tooling to forge high-γ ′ superalloys
High-γ ′ nickel superalloys are increasingly employed in aircraft turbines for their remarkable high-temperature properties to enhance engine efficiency and reduce aviation emissions. These alloys are forged at temperatures approaching 1100 °C and require careful selection of process parameters to …