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Showing 1 to 7 of 7 for “"Dielectric charging"”.

  1. Stochastic multiphysics modeling of RF MEMS switches

    … limiting the lifetime of MEMS switches, dielectric charging is considered to be the most critical. It can cause the switch to either remain stuck after removal of the actuation voltage or to fail to contact under application of voltage. There is a need for accurate and computationally …

    uiuc Repository record for Stochastic multiphysics modeling of RF MEMS switches (opens in a new tab)

  2. Micro-opto-mechanical switching and tuning for integrated optical systems

    … of this work include a new study of dielectric charging, analysis of the use of titanium nitride as structural material for MEMS, two new MEMS actuation techniques that lead to higher speed and/or lower actuation volt- age, and a feasibility analysis for wavelength tuning using a …

    mit Repository record for Micro-opto-mechanical switching and tuning for integrated optical systems (opens in a new tab)

  3. Choosing a gate dielectric for graphene based transistors

    … In this thesis, different candidate gate dielectric materials are examined for use in graphene transistors. Evaporated HfO2 is ultimately used as the gate dielectric for graphene field effect transistors (FETs) on six different graphene samples. Two types of graphene were used: graphene …

    mit Repository record for Choosing a gate dielectric for graphene based transistors (opens in a new tab)

  4. Novel Design Solutions for High Reliability RF MEMS Switches

    … reliability aspects of a RF MEMS device such as dielectric charging, contact degradation and power handling.

    trento Repository record for Novel Design Solutions for High Reliability RF MEMS Switches (opens in a new tab)

  5. Characterization of ultrathin gate dielectrics and multilayer charge injection barriers

    … reduction in the thickness of the gate dielectric, SiO_2, of a MOSFET. Gate oxides in the ultrathin regime (<35 A) feature a large direct tunneling leakage current. The presence of this leakage current requires a reevaluation of standard characterization techniques as well as a …

    njit Repository record for Characterization of ultrathin gate dielectrics and multilayer charge injection barriers (opens in a new tab)

  6. Space radiation environment impacts on high power amplifiers and solar cells on-board geostationary communications satellites

    … beam lab tests, we demonstrated that internal charging occurs in the amplifier chain, potentially identifying a cause for the observed anomalies. We substantiated an approach toward understanding space weather effects on space components by obtaining and using long-duration archives of standard …

    mit Repository record for Space radiation environment impacts on high power amplifiers and solar cells on-board geostationary communications satellites (opens in a new tab)

  7. RF Ohmic MEMS Switches Utilizing Printed and Carbon Based Nanomaterials for Space Applications

    … Applications. Ohmic contact devices void of any dielectric layer are considered exclusively in order to avoid the possibility of dielectric charging during operation, which is a possible failure mode. Cantilevered topologies are solely considered, and all devices are tested unpackaged with a …

    cambridge Repository record for RF Ohmic MEMS Switches Utilizing Printed and Carbon Based Nanomaterials for Space Applications (opens in a new tab)