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Showing 1 to 1 of 1 for “"Die-attach Fatigue"”.

  1. Thermal Characterization of Die-Attach Degradation in the Power MOSFET

    … by the growth of voids and other defects in the die-attach layer. The goal of this dissertation is to develop measurement techniques and finite element simulations that can measure the changes in thermal performance caused by changes in die-attach voided area. These experimental results and …

    vt Repository record for Thermal Characterization of Die-Attach Degradation in the Power MOSFET (opens in a new tab)