Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
Results
Showing 1 to 1 of 1 for “"Dictionary based test data compression"”.
-
Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems
… first we analyze and evaluate, the already known test data compression schemes for post-manufacturing testing and the DFT mechanisms for the enhancement of in-field testing and circuit reliability. We propose a new dictionary based test data compression method for post-manufacturing testing and we …