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Showing 1 to 2 of 2 for “"Diagnostic Test Pattern Generation"”.

  1. Diagnostic test set evaluation and enhancement

    … to two important diagnosis topics, namely diagnostic fault simulation and diagnostic test pattern generation. First, a diagnostic fault simulator for stuck-at faults in sequential circuits that is both time and space efficient is described. The simulator represents indistinguishable classes …

    uiuc Repository record for Diagnostic test set evaluation and enhancement (opens in a new tab)

  2. Online Techniques for Enhancing the Diagnosis of Digital Circuits

    The test process for semiconductor devices involves generation and application of test patterns, failure logging and diagnosis. Traditionally, most of these activities cater for all possible faults without making any assumptions about the actual defects present in the circuit. As the size of the …

    vt Repository record for Online Techniques for Enhancing the Diagnosis of Digital Circuits (opens in a new tab)