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Showing 1 to 3 of 3 for “"Diagnostic Test Generation"”.

  1. Automatic Test Generation Techniques for Sequential Circuits

    Finally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are …

    uiuc Repository record for Automatic Test Generation Techniques for Sequential Circuits (opens in a new tab)

  2. Diagnostic test set evaluation and enhancement

    … to two important diagnosis topics, namely diagnostic fault simulation and diagnostic test pattern generation. First, a diagnostic fault simulator for stuck-at faults in sequential circuits that is both time and space efficient is described. The simulator represents indistinguishable classes …

    uiuc Repository record for Diagnostic test set evaluation and enhancement (opens in a new tab)

  3. Techniques for Enhancing Test and Diagnosis of Digital Circuits

    Test and Diagnosis are critical areas in semiconductor manufacturing. Every chip manufactured using a new or premature technology or process needs to be tested for manufacturing defects to ensure defective chips are not sold to the customer. Conventionally, test is done by mounting the chip on an …

    vt Repository record for Techniques for Enhancing Test and Diagnosis of Digital Circuits (opens in a new tab)