Global ETD Search
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Showing 1 to 3 of 3 for “"Diagnostic Resolution"”.
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Integrated Enhancement of Testability and Diagnosability for Digital Circuits
… coverage</em> by 48% while maintaining similar diagnostic resolution. Built-in Self Test (BIST) is a technique of adding additional blocks of hardware to the circuits to allow them to perform self-testing. This enables the circuits to test themselves thereby reducing the dependency on the …
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Integration of an X-Y prober with CAD driven database and test generation software for the testing of printed circuit boards
… boards is a process capable of providing high diagnostic resolution, the technique is inefficient when it is performed manually. The throughput of board testing is bottlenecked because of the time required for an operator to manually move a probe to a specific location on the board under test …
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Search State Extensibility based Learning Framework for Model Checking and Test Generation
… to the physical failure analysis step, efficient diagnostic patterns are essential. Towards this objective, we propose an incremental framework that utilizes our learning technique for a branch-and-bound procedure. Further, it learns from the ATPG phase where detection-patterns are generated and …