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Showing 1 to 1 of 1 for “"Design for Diagnosability"”.
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Integrated Enhancement of Testability and Diagnosability for Digital Circuits
… test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid <em>silicon diagnosis</em>. In this thesis, test point insertions are conducted with the aim to detect more faults and also …