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Showing 1 to 1 of 1 for “"Delay faults (Semiconductors)"”.
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Characterizing within-die and die-to-die delay variations introduced By process variations and SOI history effect
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation techniques to reduce the detrimental effects of delay variations, particularly those that occur within-die, new methods of …