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Showing 1 to 9 of 9 for “"Delay Testing"”.

  1. Delay Testing in Nanoscale Technology under Process Variations

    … test approaches have focused on identifying and testing a number of critical paths in the circuit, and aimed at the efficiency of the searching process. However, the statistical circuit model, which better describes the circuit timing behavior under variations, is not yet sufficiently …

    passau-thes Repository record for Delay Testing in Nanoscale Technology under Process Variations (opens in a new tab)

  2. Search-space Aware Learning Techniques for Unbounded Model Checking and Path Delay Testing

    … two related problems in Design Verification and Testing: Unbounded Model Checking and Path Delay Fault Testing, that commonly suffer from extremely large memory requirements. We propose efficient representations and intelligent learning techniques that reason on the problem structure and take …

    vt Repository record for Search-space Aware Learning Techniques for Unbounded Model Checking and Path Delay Testing (opens in a new tab)

  3. ATPG and DFT Algorithms for Delay Fault Testing

    … density and increasing clock rate on chips, delay testing is becoming a necessity in industry to maintain test quality for speed-related failures. The purpose of delay testing is to verify that the circuit operates correctly at the rated speed. However, functional tests for delay defects are …

    vt Repository record for ATPG and DFT Algorithms for Delay Fault Testing (opens in a new tab)

  4. Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

    … of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test …

    purdue-thes Repository record for Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests (opens in a new tab)

  5. An investigation of sensitization conditions and test effectiveness for CMOS faults

    Testing of digital circuits ensures functionality and reliability of the circuits. Previous research has addressed the inadequacies of conventional test methods based on line stuck-at faults in testing CMOS circuits and has proposed new test methods. In this research, the effectiveness of …

    vt Repository record for An investigation of sensitization conditions and test effectiveness for CMOS faults (opens in a new tab)

  6. An investigation of delay fault testing for multi voltage design

    … This work is aimed at finding a generalised delay testing method for MVD. There has been little work to date on testing such systems, but testing the smallest number of operating voltages reduces testing costs. In the initial stage, the impact of varying supply voltage on different types of …

    soton Repository record for An investigation of delay fault testing for multi voltage design (opens in a new tab)

  7. Perceptions, Attitudes and Acceptability of HIV Testing Among Sub-Saharan African Immigrants in Chicago

    <p>HIV testing is a primary strategy in HIV prevention and is associated with a myriad of benefits including positive behavior changes and enhanced access to HIV care services and support. However, African immigrants delay testing and are often diagnosed with late stage HIV infection and symptoms …

    loyola-thes Repository record for Perceptions, Attitudes and Acceptability of HIV Testing Among Sub-Saharan African Immigrants in Chicago (opens in a new tab)

  8. High Quality Transition and Small Delay Fault ATPG

    Path selection and generating tests for small delay faults is an important issue in the delay fault area. A novel technique for generating effective vectors for delay defects is the first issue that we have presented in the thesis. The test set achieves high path delay fault coverage to capture …

    vt Repository record for High Quality Transition and Small Delay Fault ATPG (opens in a new tab)