Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 14 of 14 for “"Defect mitigation"”.
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Real-Time Thermography for In Operando Additive Manufacturing Defect Mitigation using a Machine Learning Approach
… continues to be confronted by process-induced defects, such as surface irregularities, geometric distortions, and porosity caused by multilayer effects and unoptimized parameters. The structural integrity and reliability of the printed components are compromised by these imperfections. Defect …
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Smart In-Process Inspection with Human-Automation Symbiosis in Industry 5.0 Manufacturing Systems
… strategy, enabling prompt identification of defective parts and real-time process control through defect mitigation. Consequently, smart in-process inspection (s-IPI) has emerged as a critical research area in manufacturing. Furthermore, as manufacturing technologies advance, the relationship …
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Ensemble Modelling of in situ Feature Variables for Printed Electronics Manufacturing with in situ Process Control Potential
… situ process control for variation reduction and defect mitigation. A real case study is investigated to demonstrate the advantages of the proposed method.
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Towards Zero Defect Manufacturing in Multi-Stage Production Systems
… and quickly eliminate manufacturing quality defects. Many companies tend to prioritize production speed rather than overall throughput, and are hypothesized to be below the optimal level of investment in quality systems when taking into account the full cost of bad quality. While traditional …
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Understanding electronic defects in organic solar cells: Defect identification, characterization & mitigation
… – accounting for 50-60% of losses. Electronic defect bands can significantly affect both these bottlenecks, introducing charged trap sites, Shockley-Read-Hall centers, or both. Thus, the identification, characterization and mitigation of these defects largely remain open and important areas of …
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Component-derived manufacturing yield prediction in circuit card design and assembly
… Operator mistakes, design errors, and defective parts lead to thousands of dollars in troubleshooting and rework costs per product. Raytheon Integrated Defense Systems (IDS) Circuit Card Assembly (CCA) manufactures highly complex circuit cards at a high mix / low volume scale for …
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Optimization for advanced lithography
… challenges in EUV lithography is how to utilize defective blanks to produce valid EUV masks. One effective defect mitigation approach is to cover the defects with device patterns such that mask defect will not impact the printing on wafer. We first present an efficient layout shifting algorithm …
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Coating Thermal Noise in Gravitational-Wave Detectors
… heat treatment. While challenges related to defect formation during annealing and discrepancies between different noise measurement methodologies were identified, ongoing research, particularly on defect mitigation in materials like titania-germania, continues to advance the field. The …
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Design-technology co-optimization in next generation lithography
… as a new illumination system, we focus on a defect mitigation algorithm. EUV process is a new process compared to the conventional 193 nm immersion lithography. With only 13.5 nm wavelength, EUV process has a capability to work on the circuit in sub-20 nm technology node. However, before the …
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Smart Process Design with Machine Learning for Quality Assurance in Metal Additive Manufacturing
… adoption of LPBF remains limited by recurring defects such as porosity, residual stresses, and deformation, which compromise the structural integrity and dimensional accuracy of printed parts. Addressing these challenges, this dissertation presents three complementary methodologies: (1) …
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Smart Additive Manufacturing Using Advanced Data Analytics and Closed Loop Control
… based on spectral graph theory is developed for defect detection in online quality monitoring of AM. The most informative feature is extracted and integrated with a statistical control chart, which can effectively detect the anomalies caused by cyber-physical attack. (2) To understand the …
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Process Monitoring and Control of Advanced Manufacturing based on Physics-Assisted Machine Learning
… with limited sensors. -To achieve online defect mitigation of new defects that occurred during the printing due to the complex process dynamics of the AM process, a novel Reinforcement Learning (RL)-based algorithm is proposed. The proposed method is to learn the machine parameter …
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Overcoming Longstanding Synthesis Challenges Toward Realizing the Full Device Potential of III-Nitride Semiconductors
… Ω-cm, respectively, are achieved. Doping and defect states in doped aluminum nitride films are examined via cathodoluminescence (CL) spectroscopy. Energy levels within the band gap are observed and potential associated defects are proposed. Fermi-Dirac statistics are used to identify three …
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Identification and mitigation of performance-limiting defects in epitaxially grown kerfless silicon for solar cells
… its single-crystal structure and low structural defect density. The goals of this research effort are to identify the root cause of underperformance of epitaxial wafers, to develop defect-mitigation strategies, and to translate these to electronic performance improvements. Low carrier lifetimes, …