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Showing 1 to 9 of 9 for “"Contact-resonance"”.

  1. Investigation of a contact resonance atomic force microscopy scan speed phenomenon

    … perform more accurate quantitative imaging using contact-resonance AFM and other contact-mode AFM techniques at higher scan speeds. This thesis presents evidence to confirm the existence of a scan speed dependent contact-mode AFM phenomenon and applies a squeeze film hydrodynamic lubrication model …

    unr Repository record for Investigation of a contact resonance atomic force microscopy scan speed phenomenon (opens in a new tab)

  2. Contact Resonance Atomic Force Microscopy using advanced sensors and post-processing techniques

    … and can achieve a nano-scale resolution. Contact resonance spectroscopy allows the estimation of mechanical properties by measuring the sensor-sample coupled system resonance frequency. To date, contact resonance has been limited to conventional sensors, thus, new advanced sensors with …

    unr Repository record for Contact Resonance Atomic Force Microscopy using advanced sensors and post-processing techniques (opens in a new tab)

  3. Quantitative viscoelastic spectroscopy of polymer films using Lorentz force actuated contact resonance atomic force microscopy

    Embargo set by: Seth Robbins for item 50524 Lift date: 2016-09-16T17:13:01Z Reason: Author requested closed access (OA after 2yrs) in Vireo ETD system

    uiuc Repository record for Quantitative viscoelastic spectroscopy of polymer films using Lorentz force actuated contact resonance atomic force microscopy (opens in a new tab)

  4. Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM

    … a method to experimentally calibrate the contact stiffness of an atomic force microscope (AFM) cantilever tip in contact with a surface, which is a critical step in the measurement of nano-mechanical properties. The calibration exploits the relationship between contact resonance (CR) …

    uiuc Repository record for Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM (opens in a new tab)

  5. Design and fabrication of granular materials for surface acoustic waves

    … typically involve macroscopic particles whereas contact-based vibrations of microparticles remain largely unexplored. The adhesion which can be neglected on millimeter scale is significant on micron scales and therefore microparticles are expected to yield qualitatively different dynamics. We …

    mit Repository record for Design and fabrication of granular materials for surface acoustic waves (opens in a new tab)

  6. Probing local thermal, mechanical, and optical properties utilizing dynamic cantilever response in contact mode atomic force microscopy

    … and implementation of micromechanical contact stiffness devices which provide a range of known contact stiffness. These devices are useful for calibrating dynamic cantilever response as a function of contact stiffness, which is critical for AFM measurements of mechanical properties. …

    uiuc Repository record for Probing local thermal, mechanical, and optical properties utilizing dynamic cantilever response in contact mode atomic force microscopy (opens in a new tab)

  7. Interfacial Properties of Graphene and 2D Materials Heterostructures Investigated by Scanning Probe Microscopy

    … probe microscopy (SPM) techniques, including contact resonance atomic force microscopy (CR-AFM) and piezoresponse force microscopy (PFM), are applied to study the interfacial mechanical and piezoelectrical properties of graphene and 2D materials heterostructures. For the first time, CR-AFM is …

    duke Repository record for Interfacial Properties of Graphene and 2D Materials Heterostructures Investigated by Scanning Probe Microscopy (opens in a new tab)

  8. Optical transient grating measurements of micro/nanoscale thermal transport and mechanical properties

    … behavior due to the interaction between an axial contact resonance of the microspheres and the surface acoustic wave at a frequency of -200MHz for the 1 [mu]m spheres and -700 MHz for the 0.5 [m spheres. The experimental measurements were fit with an analytical model in which the contact stiffness …

    mit Repository record for Optical transient grating measurements of micro/nanoscale thermal transport and mechanical properties (opens in a new tab)

  9. Advancing AFM Nanometrology Through Experimental FSI Quantification, Novel Sensor Design, and Fractional ODE-based Material Models

    … tool to perform nanometrology. Especially, contact resonance (CR) AFM has been used to perform accurate nanomaterial characterization due to its advantage over other similar modes. While performing CR-AFM, the material is brought into an intimate net-repulsive contact with a cantilever tip …

    unr Repository record for Advancing AFM Nanometrology Through Experimental FSI Quantification, Novel Sensor Design, and Fractional ODE-based Material Models (opens in a new tab)