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Showing 1 to 2 of 2 for “"Contact Resonance AFM"”.

  1. Investigation of a contact resonance atomic force microscopy scan speed phenomenon

    … have been observed via atomic force microscopy (AFM) experiments. Understanding the cause of these phenomena is important to perform more accurate quantitative imaging using contact-resonance AFM and other contact-mode AFM techniques at higher scan speeds. This thesis presents evidence to confirm …

    unr Repository record for Investigation of a contact resonance atomic force microscopy scan speed phenomenon (opens in a new tab)

  2. Probing local thermal, mechanical, and optical properties utilizing dynamic cantilever response in contact mode atomic force microscopy

    … features. Atomic force microscopy (AFM) is a powerful tool for studying nanometer-scale behavior due to excellent spatial resolution (tip radius < 25 nm) and the ability to measure dynamic surface deformation with sub-picometer precision. Measurement of dynamic surface deformation in …

    uiuc Repository record for Probing local thermal, mechanical, and optical properties utilizing dynamic cantilever response in contact mode atomic force microscopy (opens in a new tab)