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Showing 1 to 4 of 4 for “"Conductive Atomic Force Microscopy (AFM)"”.
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A Study on the Nature of Anomalous Current Conduction in Gallium Nitride
… measurements on NiIAu Schottky diodes and CAFM. Current-voltage (IV) mechanisms will identify conduction mechanisms on diodes, and CAFM measurements will investigate the microstructure of conduction in GaN thin films. With CAFM, enhanced conduction has been shown to decorate some extended …
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Study of organic molecules and nano-particle/polymer composites for flash memory and switch applications
… dissertation by injecting charges via a biased conductive atomic force microscopy (AFM) tip into molecules comprising the thin films. The Kelvin force microscopy (KFM) results revealed minimal changes in the spatial extent of the charge trapping over time after initial injection. Fabricated …
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Solid state electrochemical processes for nanofabrication
… state nano manufacturing pathways using ion conductive solid electrolytes, to develop a cost effective, simple alternative to state of the art direct writing techniques (e.g. Ebeam lithography and Focus ion beam lithography). First, a solid state electrochemical direct writing technique is …
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Characterization of electrical conductivity of carbon fiber/epoxy composites with conductive AFM and scanning microwave impedance microscopy
… conductivity of IM7 carbon fibers using two Atomic Force Microscope (AFM) –based techniques: Conductive AFM (C-AFM) and Scanning Microwave Impedance Microscopy (sMIM). Unidirectional IM7/977-3 carbon fiber/epoxy laminates were manufactured and examined with these two techniques. C-AFM was …