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Showing 1 to 2 of 2 for “"Cepstral STEM"”.

  1. Quantitative analysis of crystal lattice and defects in nanoscale functional materials by electron diffraction

    … (4D) scanning transmission electron microscopy (STEM) or 4D-STEM, is emerging as a powerful way to provide information in both real space and reciprocal space at the same time based on electron nanodiffraction. This thesis aims to develop novel data analysis approaches of SEND datasets for …

    uiuc Repository record for Quantitative analysis of crystal lattice and defects in nanoscale functional materials by electron diffraction (opens in a new tab)

  2. Underlying deformation behavior of medium/high entropy alloys using advanced electron imaging and diffraction

    … (SEND), also known as 4D scanning TEM or 4D-STEM. We use 4D-STEM to acquire position-resolved nanodiffraction patterns at the nanometer spatial resolution. The diffraction dataset are data-mined to extract local strain, orientation, and phase information. Taking advantage of recent advances …

    uiuc Repository record for Underlying deformation behavior of medium/high entropy alloys using advanced electron imaging and diffraction (opens in a new tab)