Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 2 of 2 for “"CMOS process variation"”.
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Study of CMOS process variation by multiplexing analog characteristics
… methods to characterize and model circuit variation at both the front and back end of line, where critical parameters such as threshold voltage and parasitic capacitance must be carefully modeled for accurate circuit performance. This thesis addresses this need by contributing a test …
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Development of Robust Analog and Mixed-Signal Circuits in the Presence of Process- Voltage-Temperature Variations
… addresses the problems of escalating CMOS process variability and system complexity that diminish the reliability and testability of integrated systems, especially relating to the analog and mixed-signal blocks. The proposed design techniques and circuit-level attributes are aligned …