Global ETD Search
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Showing 1 to 2 of 2 for “"Bias stress effects"”.
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Bias stress detection of dislocation resonance in lead
… attenuation and velocity and their changes with bias stress are used to test theories of bias stress effects by Hikata, Johnson, and Elbaum (HJE). Hikata amd Elbaum (HE), Alefeld, and one presented here. The only theory which survives the test and is supported by measurements is the present …
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Pentacene integrated thin-film transistors and circuits
… in circuit lifetime due to reduction in bias stress effects. A process flow for a dual VT OTFT technology, enabled using two gate metals, is presented. By using a low work function metal (aluminum) and a high work function metal (platinum), we can obtain two threshold voltage devices.