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Showing 1 to 1 of 1 for “"BVCBO"”.

  1. A Comprehensive Study of Safe-Operating-Area, Biasing Constraints, and Breakdown in Advanced SiGe HBTs

    Grens, Curtis M.Georgia Institute of Technology2005

    This thesis presents a comprehensive assessment of breakdown and operational voltage constraints in state-of-the-art silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BiCMOS technology. Technology scaling of SiGe HBTs for high frequency performance results on lower breakdown …

    gatech Repository record