Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 13 of 13 for “"Automatic test equipment."”.
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Roadmap of mechanical systems design for the semiconductor automatic test equipment industry
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1998.
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An analysis of revenue and product planning for automatic test equipment manufacturers
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
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Understanding and controlling risk in product development, specifically in new technology procurement, at an automatic test equipment manufacturer
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
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Design and Analysis of a Transformer-Based Solid-State Relay
Automatic Test Equipment (ATE) systems require relays to perform complex high-speed tests on semiconductor devices. However, existing relays all come up short in some aspect. Electromechanical reed relays have a limited lifetime and slow switching speeds, while solid-state photoMOS relays have high …
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Automated power supply testing
… possible the process operator-independent. The testing stage must clearly be a reliable and fast process. This project presents an Automated Testing system used to test a switched mode power supply. It includes all the basic principles found in industrially available Automatic Test Equipment …
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Analysis of a proposal to consolidate aircraft intermediate maintenance capabilities
… discussed include manpower reduction, support equipment reduction, inventory reduction, and increased productivity. The drawbacks discussed include increased transportation costs, facilities modification costs, impacts on customer service, additional maintenance management and administrative …
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A low dispersion 2-GHz comparator
… 2-GHz comparator is an essential part of the latest automated VLSI tester by Teradyne Inc. With each new and faster CMOS logic VLSI microchips, faster and more precise comparators are needed to verify that the static discipline is being met on the many pins of the integrated circuit. As the …
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Dynamic scan chains : a novel architecture to lower the cost of VLSI test
… become larger and more complex, larger amount of test data is required to test them. This results in longer test application times, therefore, increasing cost of testing each chip. This thesis describes an architecture, named Dynamic Scan, that allows to reduce this cost by reducing the test data …
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Integration of an X-Y prober with CAD driven database and test generation software for the testing of printed circuit boards
Guided probe testing of printed circuit boards is a technique that has been well developed by automatic test equipment manufacturers to pinpoint faults. Though the guided probe technique of testing printed circuit boards is a process capable of providing high diagnostic resolution, the technique is …
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Three-dimensional routed manifolds with externally inserted cables
The Automatic Test Equipment industry must maintain a tester accuracy of roughly one tenth the pulsewidth of the device under test (DUT). Funneling a vast number of electrical signals into a very tiny area to contact the DUT while still maintaining good signal fidelity is a problem not only in the …
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Predicting performance parameters of analog and mixed-signal circuits using built-in and built-off self test
… important in cost-effective manufacturing test for mixed-signal devices. A typical SoP encapsulates many of its internal functions, and its production test is performed by application of test signals to the SoP under control of external Automatic Test Equipment (ATE). However it is a …
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Performance enhancement strategies for design and test Optimization of analog and mixed-signal circuits
… increases, cost-efficient and time-efficient testing schemes become crucial. Additionally, there is a pressing need for novel analog circuit architectures and design techniques that uphold desired performance metrics while minimizing chip area. These trends reflect the industry's drive to …
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A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing
… actual product macros, as opposed to scribe line test structures or embedded ring oscillators (RO). In addition to characterizing performance, such delay measurement techniques can be used to improve model-to-hardware correlation. Furthermore, these techniques can also be used in several contexts …