Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 7 of 7 for “"Automated test equipment"”.
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The allocation of automated test equipment capacity with variability in demand and processing rates
… develop a model for allocating the Consolidated Automated Support System (CASS) to the intermediate repair sites. The model uses integer, linear, and nonlinear programming (optimization) to determine the approximate number of CASS stations at a site based on demand, operational availability of …
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Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
Methods for Extending High-Performance Automated Test Equipment (ATE) using Multi-Gigahertz FPGA Technologies Ashraf M. Majid 264 Pages Directed by Dr. David Keezer This thesis presents methods for developing multi-function, multi-GHz, FPGAbased test modules designed to enhance the performance …
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A comparative study of high voltage analog switch topologies
… processes improve. They have application in automated test equipment, variable gain feedback amplifiers, sample and hold circuits, and other switched capacitor circuits. In this document, four high voltage analog instrumentation switches were designed using different topologies. The four …
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Strategic cost management in a global supply chain
… crucial, and complicated. In the context of the automated test equipment industry, this thesis explores the impact of outsourcing on product cost and cost management practices. It examines prevailing cost management practices with reference to design and procurement, as well as methods to …
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An automated bench testing system for direct current parameters of instrumentation amplifiers
Electrical testing is performed at multiple stages in the production of analog integrated circuits (ICs). An efficient system for low-volume IC testing is one that automates bench tests and provides good measurement precision and accuracy, while costing far less than the standard automated test …
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Integrated Enhancement of Testability and Diagnosability for Digital Circuits
While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid <em>silicon diagnosis</em>. In this thesis, test point insertions are conducted with the aim to detect more faults …
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Techniques for Enhancing Test and Diagnosis of Digital Circuits
Test and Diagnosis are critical areas in semiconductor manufacturing. Every chip manufactured using a new or premature technology or process needs to be tested for manufacturing defects to ensure defective chips are not sold to the customer. Conventionally, test is done by mounting the chip on an …