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Showing 1 to 2 of 2 for “"Automated Test Pattern Generation (ATPG)"”.
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Symbolic methods for testing digital circuits
… Decision Diagrams (BDDs), in the field of testing both combinational and synchronous sequential digital circuits at gate level. <br>Both major topics, fault simulation and automated test pattern generation (ATPG), have been examined, among others, like build-in self-test, computing reset …
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Techniques for Enhancing Test and Diagnosis of Digital Circuits
Test and Diagnosis are critical areas in semiconductor manufacturing. Every chip manufactured using a new or premature technology or process needs to be tested for manufacturing defects to ensure defective chips are not sold to the customer. Conventionally, test is done by mounting the chip on an …