Global ETD Search
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Showing 1 to 1 of 1 for “"Aomic Force Microscopy"”.
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Applying scanning probe microscopy for the investigation of molecular self-assembly mechanisms and properties of designed nanomaterials
Scanning probe microscopy (SPM) for conducting surface characterizations of nanomaterials and molecular self-assembly processes is emerging as an important contribution in nanotechnology, especially towards the design of molecular electronic devices. Another area of importance is the …