Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 3 of 3 for “"Angle Resolved X-ray Photoelectron Spectroscopy (ARXPS)"”.
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Microscopic Study of Structure, Chemical Composition and Local Conductivity of La2/3Sr1/3MnO3 Films
… with unit cell precision by combining in-situ angle-resolved x-ray photoelectron spectroscopy (ARXPS), ex-situ scanning transmission electron microscopy (STEM), and electron energy loss spectroscopy (EELS). Substantial deviations in Sr doping concentrations from its bulk value are observed at …
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Surfaces and interfaces characterization for the development of diamond power electronic devices
… of the device performance. The use of the angle-resolved X-ray photoelectron spectroscopy (ARXPS) mode has prompted the reinterpretation of the electronic contributions near the surface and has allowed opening the discussion on the origin of surface p-type conduction of the hydrogenated …
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Growth and characterization of epitaxial graphene films by Molecular Beam Epitaxy
… with in-situ RHEED, ex-situ XPS, AFM, Raman Spectroscopy and Electrical Transport. Clear evidence of tensile stress is seen in the AFM and Raman studies in the graphene films grown on c-plane sapphire. Whereas, Raman studies confirm the presence of compressive stress in the graphene films grown …