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Showing 1 to 15 of 15 for “"Accelerated life testing"”.

  1. Accelerated life testing : concepts and models

    This thesis deals with the analysis of accelerated life test. First, we provide related concepts and second, we provide detailed properties of three alternative distributions, Gamma, Log-normal and Inverse Gaussian. Various models for failure times are considered which are plausible in this context …

    concordia Repository record for Accelerated life testing : concepts and models (opens in a new tab)

  2. Bootstrap-based confidence intervals in partially accelerated life testing

    "Accelerated life testing (ALT) is utilized to estimate the underlying failure distribution and related parameters of interest in situations where the components under study are designed for long life and therefore will not yield failure data within a reasonable test period. In ALT, life testing is …

    must-thes Repository record for Bootstrap-based confidence intervals in partially accelerated life testing (opens in a new tab)

  3. Design of an electro-mechanical hexapod for accelerated life testing of optical fiber assemblies

    … Focal Ratio Degradation (FRD) [3]. Therefore, a life cycle test must be conducted to study fiber behavior and measure FRD as a function of time. This thesis describes the design and design methodology of an electro-mechanical test apparatus for accelerated life testing of optical fiber …

    texas Repository record for Design of an electro-mechanical hexapod for accelerated life testing of optical fiber assemblies (opens in a new tab)

  4. Optimal and Robust Designs of Step-stress Accelerated Life Testing Experiments for Proportional Hazards Models

    Accelerated life testing (ALT) is widely used to obtain reliability information about a product within a limited time frame. The Cox s proportional hazards (PH) model is often utilized for reliability prediction. My master thesis research focuses on designing accelerated life testing experiments …

    brock Repository record for Optimal and Robust Designs of Step-stress Accelerated Life Testing Experiments for Proportional Hazards Models (opens in a new tab)

  5. Standard operating procedure for Highly Accelerated Life Testing (HALT) : design and standardization of fixture setup for circuit boards

    This thesis deals with the introduction of Highly Accelerated Life Testing (HALT) in a multinational corporation as part of a reliability improvement process for printed circuit boards (PCBs). More specifically, the thesis focuses on drafting a standard operating procedure (SOP) to standardize the …

    mit Repository record for Standard operating procedure for Highly Accelerated Life Testing (HALT) : design and standardization of fixture setup for circuit boards (opens in a new tab)

  6. Scale-up of a high-technology manufacturing startup : improving product reliability through systematic failure analysis and accelerated life testing

    … design process and to establish a framework for testing and analyzing product life so that imperative business decisions and design improvements could be made with regards to reliability. A detailed study and implementation of these process improvements to address reliability issues was conducted …

    mit Repository record for Scale-up of a high-technology manufacturing startup : improving product reliability through systematic failure analysis and accelerated life testing (opens in a new tab)

  7. Creation, validation, and implementation of a Highly Accelerated Life Testing (HALT) procedure to improve the reliability of printed circuit boards

    Highly Accelerated Life Testing (HALT) is a test methodology to evaluate the reliability of electronic and electromechanical devices. This thesis aimed at the implementation of Highly Accelerated Life Testing (HALT) on Printed Circuit Boards. A standard operating procedure for implementing Highly …

    mit Repository record for Creation, validation, and implementation of a Highly Accelerated Life Testing (HALT) procedure to improve the reliability of printed circuit boards (opens in a new tab)

  8. Developing Highly Accelerated Life Test (HALT) method to improve product robustness and shorten development cycle

    Highly Accelerated Life Testing (HALT) is often used to identify the latent defects for the printed circuit boards (PCBs) during the early stage of the product development process. The inconsistency in executing HALT may not reveal the maximum amount of design weaknesses or intermittent failures, …

    mit Repository record for Developing Highly Accelerated Life Test (HALT) method to improve product robustness and shorten development cycle (opens in a new tab)

  9. Thermal Characterization of Die-Attach Degradation in the Power MOSFET

    … MOSFET module is subject to change over its lifetime. This is caused by the growth of voids and other defects in the die-attach layer. The goal of this dissertation is to develop measurement techniques and finite element simulations that can measure the changes in thermal performance caused …

    vt Repository record for Thermal Characterization of Die-Attach Degradation in the Power MOSFET (opens in a new tab)

  10. Contributions to planning and analysis of accelerated testing

    … prevailing interest in saving time and expense,Accelerated Life Testing (ALT) and/or Accelerated Degradation Testing (ADT) are becoming an integral part of many programs for improving productsa??quality and reliability.However,appropriate analysis of ALT/ADT data and planning of ALT/ADT …

    nus Repository record for Contributions to planning and analysis of accelerated testing (opens in a new tab)

  11. Accelerated Life Test Modeling Using Median Rank Regression

    Accelerated life tests (ALT) are appealing to practitioners seeking to maximize information gleaned from reliability studies, while navigating resource constraints due to time and specimen costs. A popular approach to accelerated life testing is to design test regimes such that experimental …

    vt Repository record for Accelerated Life Test Modeling Using Median Rank Regression (opens in a new tab)

  12. Knowledge Discovery from Complex Event Time Data with Covariates

    … in reliability data analysis. Specifically, accelerated life testing (ALT) data are usually conducted by exposing test units of a product to severer-than-normal conditions to expedite the failure process. The resulting lifetime and/or censoring data are often modeled by a probability …

    arkansas Repository record for Knowledge Discovery from Complex Event Time Data with Covariates (opens in a new tab)

  13. Prognostics and health management for multi-component systems

    … components. We first introduce a gearbox accelerated life testing platform that was designed with the objective of gathering experimental data for multi-component degradation models, for the reason that multi-component systems with inter-dependencies follow a highly stochastic degradation …

    salford Repository record for Prognostics and health management for multi-component systems (opens in a new tab)

  14. Qualification of a CMOS linear image sensor LIS-1024

    … industry standard reliability tests. Therefore, accelerated life testing was conducted on the LIS series package, to support a designed life of 10 years operating at 65°C. Prior to conducting any life test, the structural design and the material system of the package was evaluated by using Finite …

    binghamton Repository record for Qualification of a CMOS linear image sensor LIS-1024 (opens in a new tab)