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Showing 1 to 1 of 1 for “"Accelerated Thermal Degradation"”.

  1. Accelerated thermal degradation testing of GAN HEMTs under high-temperature stress

    … advantages, GaN HEMTs are prone to performance degradation when exposed to elevated temperatures and electrical stress over long durations. This study aims to investigate the degradation behavior of commercial EPC90122 GaN HEMT devices under controlled high-temperature operating conditions. …

    uiuc Repository record for Accelerated thermal degradation testing of GAN HEMTs under high-temperature stress (opens in a new tab)