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Showing 1 to 10 of 10 for “"ARXPS"”.
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Concentration depth-profile reconstruction from angle-resolved XPS data using the maximum entropy method: characterization of surface film formed on Ni-18P alloy
… depth-profile should be consistent with the ARXPS data. However, transformation of XPS intensities vs. emission angle into concentrations vs. depth data is an ill posed mathematical problem. The main goal of this work was thus to develop a new, iterative algorithm based on the maximum entropy …
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Ion bombardment induced compositional changes in compound semiconductor surfaces studied by XPS combined with LEISS
… nondestructively by Angular Resolved XPS (ARXPS) and LEISS to get the initial distribution of surface composition. Ion bombardment experiments were carried out using 3keV argon ions with beam current of 1μA for a period of 50 minutes, compositional changes in the surfaces of compound …
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Investigation of growth kinetics of self-assembling monolayers by means of contact angle, optical ellipsometry, angle-resolved XPS and IR spectroscopy.
… angle, optical ellipsometry, angle-resolved XPS (ARXPS), and with grazing angle total reflection FTIR. Growth of the monolayers from dilute solutions has been monitored and Langmuir isotherm adsorption curves were fitted to experimental data. A saturated film is formed within approximately 5h …
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Surfaces and interfaces characterization for the development of diamond power electronic devices
… angle-resolved X-ray photoelectron spectroscopy (ARXPS) mode has prompted the reinterpretation of the electronic contributions near the surface and has allowed opening the discussion on the origin of surface p-type conduction of the hydrogenated surface. Regarding oxygen termination, the ARXPS …
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Investigation of the effects of low energy high dose ion bombardment in metals and compound semiconductors
… energy. The bombarded samples were examined by ARXPS. After each complete implantation, XPS depth profiles were created using Ar+ beam at energy 2 ke V and current density 2 μA/cm2 . As the current density was chosen as one of the parameters, accurate determination of current density was very …
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Untersuchungen zu Schichtwachstum und Grenzflächen an Ta-basierten Dünnschichten mittels XPS
… Photoelektronenspektroskopie (ARXPS). Die Analysen erfolgen in situ, ohne Unterbrechung des Ultrahochvakuums, um die Deposite vor Oxidation und Kontamination zu schützen. Zur zerstörungsfreien Tiefenprofilanalyse wird ein Quantifizierungsalgoritmus beschrieben und angewandt. Für …
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Surface:plasma interactions in GaAs subjected to capacitively coupled RF plasmas
… were measured using AFM. Angular Resolved XPS (ARXPS) was also employed for depth analysis of the composition of the surface layers. An important role in this study was determination of oxide thickness using XPS data. The study of surface - plasma interaction was undertaken by correlating …
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Microscopic Study of Structure, Chemical Composition and Local Conductivity of La2/3Sr1/3MnO3 Films
… angle-resolved x-ray photoelectron spectroscopy (ARXPS), ex-situ scanning transmission electron microscopy (STEM), and electron energy loss spectroscopy (EELS). Substantial deviations in Sr doping concentrations from its bulk value are observed at both the interface and surface. Deviation at the …
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CORROSION PROTECTION OF COPPER IN OILY MEDIA: MICROSCOPIC MECHANISMS
… after 86.4 Ks. Depth-profiling in ToF-SIMS and ARXPS provide evidence for two distinct adsorption configurations for TTAH on Cu – polymerized layer, and monomer layer. TTAH adsorption is found to take place on Cu2O. Studying the time-dependent evolution of the surface film suggests a …
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Growth and characterization of epitaxial graphene films by Molecular Beam Epitaxy
Growing macroscopic graphene films with the aim of making graphene commerically viable is being researched a lot recently. Although graphene isolated by exfoliation of Highly Oriented Pyrolytic Graphite (HOPG) crystals has been in place for sometime now, its micro sample size has triggered the …