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Showing 1 to 1 of 1 for “"AFM, IR-spectroscopy, MEMS, soft lithography"”.
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Fabrication of Hybrid Atomic Force Microscopy Probe for Enhancing Sensitivity of AFM-Infrared Nanoscale Spectroscopy
Atomic force microscopy infrared-spectroscopy (AFM-IR) has emerged as a novel method that combines nanoscale resolution of AFM with IR-spectroscopy. In this technique heat generated by IR absorption within the sample will induce thermal expansion, which is detected by AFM probe, in contact with the …