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Showing 1 to 2 of 2 for “"200 upsilon m"”.
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Application of scanning micro-tip and UHV Kelvin probes in surface and material characterisation.
… tip calibration. A new actively shielded upsilon-tip (200 upsilon m diameter) is introduced to increase spatial resolution for CPD and topographic scans in order resolve features in the upsilon m region. The upsilon-SKP has been applied in ambient to multi-crystalline Si; we show …
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Development and application of the scanning Kelvin probe for solar cell defect analysis.
… before introducing a novel "actively shielded" upsilon-tip (200 upsilon m) designed to nullify the effect of the tip sides. Details of the manufacturing process for this new tip are discussed and the tip performance is evaluated. The Kelvin probe technique was successfully able to detect, image …