Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
Results
Showing 1 to 2 of 2 for “"1149.1"”.
-
Improved Signal Integrity in IEEE 1149.1 Boundary Scan Designs
… issues in the use and application of the IEEE 1149.1 Standard at the board level in conjunction with its test system. Setup or hold times violations may occur in a boundary scan chain using IEEE 1149.1 compliant devices. A practical study of the TDI-TDO scan data path has been conducted to show …
-
High level behavioural modelling of boundary scan architecture.
… tool which enables the integration of the IEEE 1149.1/JTAG Boundary Scan Test Architecture automatically into an ASIC (Application Specific Integrated Circuit) design. The tool requires the original design (the ASIC) to be described in VHDL-IEEE 1076 Hardware Description Language. The tool …