Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.

Denig, Tobias

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West Virginia University

Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.

dc:creator Denig, Tobias

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Level thesis:degree_level: Dissertation

Author and committee

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Author dc:creator: Denig, Tobias

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Identifier: https://researchrepository.wvu.edu/etd/8742
OAI record oai:identifier: https://researchrepository.wvu.edu/do/oai/?verb=GetRecord&metadataPrefix=oai_etdms&identifier=oai%3Aresearchrepository.wvu.edu%3Aetd-9739

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Harvested from: West Virginia University
Base URL: researchrepository.wvu.edu/do/oai/
Last updated: 2026-08-21
Source record: OAI-PMH GetRecord

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Dissertation

citation

Denig, Tobias. Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.. Dissertation thesis, https://doi.org/10.33915/etd.8742

Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.

Degree

Author and committee

Identifiers

Chain of custody

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