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Virginia Tech

Power Fingerprinting for Integrity Assessment of Embedded Systems

Abstract

dc:description.abstract

This dissertation introduces Power Fingerprinting (PFP), a novel technique for assessing the execution integrity of embedded devices. A PFP monitor is an external device that captures the dynamic power consumption of a processor using fine-grained measurements at the clock-cycle level and applies anomaly detection techniques to determine whether the integrity of the system has been compromised. PFP uses a set of trusted signatures from the target code that are extracted during a pre-characterization process. PFP provides significant visibility into the internal execution status, making it extremely robust against evasion. Because of its independence and physical separation, PFP prevents attacks on the monitor itself and introduces minimal overhead on platforms with resource constraints. Due to its anomaly detection operation, PFP is effective against unknown (zero-day) attacks. This dissertation demonstrates the feasibility of PFP on different platforms with different configurations and architectural complexities. Experimental results demonstrate the feasibility of PFP in a basic deterministic embedded platform for radio applications in two different areas: security and regulatory certification. For more complex, non-deterministic platforms, this works presents feasibility results for monitoring the execution integrity of complex software on a high-performance Android platform, including the ability to detect a real privilege escalation attack. In addition, the dissertation develops several general techniques to implement and integrate PFP into embedded platforms such as a general monitoring architecture, a methodology to characterize software modules and extract signatures, and an approach to perform board characterization and improve monitoring sensitivity.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Electrical and Computer Engineering
Department dc:contributor.department
Electrical and Computer Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2011

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Aguayo Gonzalez, Carlos R.
Chair dc:contributor.committeechair
  • Reed, Jeffrey H.
Committee members dc:contributor.committeemember
  • Tranter, William H.
  • Bostian, Charles W.
  • Park, Jung-Min Jerry
  • Edwards, Stephen H.

Subjects

dc:subject × 5

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en_US

Identifiers

dc:identifier.*
Dc Identifier Other
etd-12192011-094002
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/77291

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Aguayo Gonzalez, Carlos R.. Power Fingerprinting for Integrity Assessment of Embedded Systems. doctoral thesis, Virginia Tech, 2011. http://hdl.handle.net/10919/77291