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Virginia Polytechnic Institute and State University

Moiré interferometry for out-of-plane displacement measurements

Abstract

dc:description.abstract

Moiré interferometry is a relatively new branch of photomechanics that utilizes a diffraction grating on the specimen to determine surface displacements. To date, it has been used primarily to determine in-plane displacements of the specimen surface. The objective of this work is to demonstrate that the technique is capable of determining out-of-plane displacements as well. A high-frequency phase grating on a specimen surface is illuminated by oblique beams; two diffracted beams are recorded by holographic interferometry. If the wavefront warpages of the two diffracted beams are characterized by fringe orders, Nₐ and N<sub>b</sub>, it is demonstrated that the in-plane displacements are proportional to Nₐ - N<sub>b</sub>, while out-of-plane displacements are proportional to Nₐ + N<sub>b</sub>. Initially, these subtractive and additive parameters are determined numerically, and the resulting displacements are compared to displacements measured by well-accepted prior experimental methods. Excellent agreement with these proven methods is shown. Using this remarkably simple relationship between wavefront warpages, an experimental procedure is developed which is capable of simultaneously determining the in-plane and out-of-plane displacements of a specimen surface. The method requires only one photographic exposure of the deformed specimen, with displacement information being extracted through the use of optical filtering. The fact that the information required to yield these patterns can be obtained from a single photographic recording not only makes this an experimentally simple technique to use, but provides the capability of analyzing dynamic events as well. The sensitivity of measurements made by utilizing this technique are directly proportional to the frequency of the specimen grating. Therefore, it is desirable to obtain specimen gratings with frequencies on the order of 500-2000 lines/mm ( 12, 700 - 50,800 lines/in.). A technique is developed whereby high frequency moire gratings with highly reflective surfaces can be transferred to workpieces made from most engineering materials. Specimen gratings with frequencies as high as 2000 lines/mm (50,800 lines/in.) and exhibiting 10 percent diffraction efficiency in the first diffraction order have been applied to numerous specimens using simple laboratory techniques.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Engineering Mechanics
Department dc:contributor.department
Engineering Mechanics
Grantor dc:publisher
Virginia Polytechnic Institute and State University
Year dc:date.issued
1981

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Basehore, Michael L.

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en_US

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/10919/74178
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/74178

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Basehore, Michael L.. Moiré interferometry for out-of-plane displacement measurements. doctoral thesis, Virginia Polytechnic Institute and State University, 1981. http://hdl.handle.net/10919/74178