Simulation of X-ray imaging systems for luggage inspection

This thesis describes XL, an x-ray imaging simulator for luggage inspection. This software system runs on a workstation and models x-ray sources, x-ray detectors and objects between them. A simple graphical interface permits the user to specify simulation parameters and inputs. XL then uses Monte Carlo methods to simulate x-ray interaction with matter, including the photoelectric effect, coherent scattering, and incoherent scattering. Finally, XL can produce x-ray images which agree closely with experimental data obtained from a commercial luggage scanner. The simulator will be a valuable tool in the development of future x-ray scanners, particularly those designed to detect explosives in luggage.

Name thesis:degree_name

Master of Science

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Electrical Engineering

Department dc:contributor.department

Electrical Engineering

Grantor dc:publisher

Virginia Tech

Year dc:date.issued

1995

Author dc:creator

• Xie, Wei

Chair dc:contributor.committeechair

• Abbott, A. Lynn

Committee members dc:contributor.committeemember

• Conners, Richard W.
• Kline, D. Earl

• X-ray scanning
• explosive detection
• MCNP
• Monte Carlo simulation

Statement dc:rights

• In Copyright

Licence dc:rights.uri

• http://rightsstatements.org/vocab/InC/1.0/

Language dc:language.iso

en

Dc Identifier Other

etd-12232009-020653

OAI identifier oai:identifier

oai:vtechworks.lib.vt.edu:10919/46417