Abstract
dc:description.abstractMicroprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered.
Degree
thesis:*- Name thesis:degree_name
- Master of Science
- Level thesis:degree_level
- masters
- Discipline thesis:degree_discipline
- Electrical Engineering
- Department dc:contributor.department
- Electrical Engineering
- Grantor dc:publisher
- Virginia Tech
- Year dc:date.issued
- 1993
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Becker, Brian Alan
- Chair dc:contributor.committeechair
-
- Tront, Joseph G.
- Committee members dc:contributor.committeemember
-
- Armstrong, James R.
- Ha, Dong Sam
Rights
dc:rights- Statement dc:rights
-
- In Copyright
- Licence dc:rights.uri
- Language dc:language.iso
- en
Identifiers
dc:identifier.*- Dc Identifier Other
- etd-11102009-020108
- OAI identifier oai:identifier
- oai:vtechworks.lib.vt.edu:10919/45599